Cite
Research on environmental reliability test and assessment of AI devices under vibration stress1.
MLA
Li, Xingge, et al. “Research on Environmental Reliability Test and Assessment of AI Devices under Vibration Stress1.” Journal of Intelligent & Fuzzy Systems, vol. 46, no. 1, Jan. 2024, pp. 1833–52. EBSCOhost, https://doi.org/10.3233/JIFS-234179.
APA
Li, X., Zhang, S., Chen, X., Wang, Y., & Fan, Z. (2024). Research on environmental reliability test and assessment of AI devices under vibration stress1. Journal of Intelligent & Fuzzy Systems, 46(1), 1833–1852. https://doi.org/10.3233/JIFS-234179
Chicago
Li, Xingge, Shufeng Zhang, Xun Chen, Yashun Wang, and Zhengwei Fan. 2024. “Research on Environmental Reliability Test and Assessment of AI Devices under Vibration Stress1.” Journal of Intelligent & Fuzzy Systems 46 (1): 1833–52. doi:10.3233/JIFS-234179.