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Value-added tax, product innovation and export quality: evidence from China.

Authors :
Wang, Yuxiang
Liu, Yanzhou
Source :
Applied Economics Letters; Apr2024, Vol. 31 Issue 7, p640-645, 6p
Publication Year :
2024

Abstract

In this study, we examine the relationship between value-added tax burden and export quality. Our results show that the increase of VAT burden leads to lower export quality. We also find that the decline in export quality may be caused by the decrease of product innovation. Moreover, the empirical evidence on patent application shows that VAT burden mainly reduces invention and utility model patents, instead of design patents. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
13504851
Volume :
31
Issue :
7
Database :
Complementary Index
Journal :
Applied Economics Letters
Publication Type :
Academic Journal
Accession number :
175795807
Full Text :
https://doi.org/10.1080/13504851.2022.2141437