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Reliability prediction of metering terminal based on whole annealing genetic algorithm wavelet neural network.
- Source :
- Electrical Measurement & Instrumentation; Feb2024, Vol. 61 Issue 2, p179-184, 6p
- Publication Year :
- 2024
Details
- Language :
- Chinese
- ISSN :
- 10011390
- Volume :
- 61
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Electrical Measurement & Instrumentation
- Publication Type :
- Academic Journal
- Accession number :
- 176018004
- Full Text :
- https://doi.org/10.19753/j.issn1001-1390.2024.02.026