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Reliability prediction of metering terminal based on whole annealing genetic algorithm wavelet neural network.

Authors :
XU Hongwei
CONG Zhongxiao
YANG Xiaolu
ZHOU Zhongming
CHEN Yinsheng
LIN Haijun
Source :
Electrical Measurement & Instrumentation; Feb2024, Vol. 61 Issue 2, p179-184, 6p
Publication Year :
2024

Details

Language :
Chinese
ISSN :
10011390
Volume :
61
Issue :
2
Database :
Complementary Index
Journal :
Electrical Measurement & Instrumentation
Publication Type :
Academic Journal
Accession number :
176018004
Full Text :
https://doi.org/10.19753/j.issn1001-1390.2024.02.026