Cite

BIST-Supported Cryogenic Write Trimming With In-MRAM Computing Case Study.

MLA

Hou, Yaoru, et al. “BIST-Supported Cryogenic Write Trimming With In-MRAM Computing Case Study.” IEEE Transactions on Nanotechnology, vol. 22, July 2023, pp. 126–35. EBSCOhost, https://doi.org/10.1109/TNANO.2023.3248662.



APA

Hou, Y., Liu-Sun, C., Liu, B., Zhang, H., & Cai, H. (2023). BIST-Supported Cryogenic Write Trimming With In-MRAM Computing Case Study. IEEE Transactions on Nanotechnology, 22, 126–135. https://doi.org/10.1109/TNANO.2023.3248662



Chicago

Hou, Yaoru, Chenxing Liu-Sun, Bo Liu, Hao Zhang, and Hao Cai. 2023. “BIST-Supported Cryogenic Write Trimming With In-MRAM Computing Case Study.” IEEE Transactions on Nanotechnology 22 (July): 126–35. doi:10.1109/TNANO.2023.3248662.