A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model.

MLA

Su, Yuanzhang, et al. “A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model.” Applied Sciences (2076-3417), vol. 14, no. 6, Mar. 2024, p. 2410. EBSCOhost, https://doi.org/10.3390/app14062410.

APA

Su, Y., Guo, X., Luo, H., Wang, J., & Liu, Z. (2024). A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model. Applied Sciences (2076-3417), 14(6), 2410. https://doi.org/10.3390/app14062410

Chicago

Su, Yuanzhang, Xinfeng Guo, Hang Luo, Jingyuan Wang, and Zhen Liu. 2024. “A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model.” Applied Sciences (2076-3417) 14 (6): 2410. doi:10.3390/app14062410.