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Evaluation of the effect of the addition of TiO2 on the dielectric behaviour of YNbO4 ceramic using impedance spectroscopy.
- Source :
- Journal of Materials Science: Materials in Electronics; Mar2024, Vol. 35 Issue 8, p1-10, 10p
- Publication Year :
- 2024
-
Abstract
- The present article evaluates the effect of the addition of TiO<subscript>2</subscript> on the dielectric properties in the radiofrequency region of the YNbO<subscript>4</subscript> ceramic matrix. X-ray diffraction (XRD) showed that the YNT (Y(Nb<subscript>0.5</subscript>Ti<subscript>0.5</subscript>)<subscript>2</subscript>O<subscript>6</subscript>) phase formed from the reaction between YNbO<subscript>4</subscript> (YNO) and TiO<subscript>2</subscript> in the investigated composites. Complex impedance spectroscopy (CIS) analysis was utilized and it was observed that the activation energy (E<subscript>a</subscript>) values of the materials varied between 1.13 and 2.31 eV. Nyquist diagrams were fitted for the materials using three associations of resistor-constant phase element (R-CPE), with an exception for the YNO40 composite that used only two associations. All compositions presented values of n in the range of 0.6 ≤ n ≤ 1 for grain resistance (R<subscript>g</subscript>) and grain boundary resistance (R<subscript>gb</subscript>), indicating a capacitive character. Temperature capacitance coefficient (TCC) values were also calculated. At many frequencies, it was observed that the composites presented values in the range of ± 1500 ppm °C<superscript>−1</superscript>, indicating that the evaluated systems could be employed as Class 1 capacitors according to EIA RS-198. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09574522
- Volume :
- 35
- Issue :
- 8
- Database :
- Complementary Index
- Journal :
- Journal of Materials Science: Materials in Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 176282721
- Full Text :
- https://doi.org/10.1007/s10854-024-12315-y