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A meta-learning network method for few-shot multi-class classification problems with numerical data.

Authors :
Wu, Lang
Source :
Complex & Intelligent Systems; Apr2024, Vol. 10 Issue 2, p2639-2652, 14p
Publication Year :
2024

Abstract

The support vector machine (SVM) method is an important basis of the current popular multi-class classification (MCC) methods and requires a sufficient number of samples. In the case of a limited number of samples, the problem of over-learning easily occurs, resulting in unsatisfactory classification. Therefore, this work investigates an MCC method that requires only a small number of samples. During model construction, raw data are converted into two-dimensional form via preprocessing. Via feature extraction, the learning network is measured and the loss function minimization principle is considered to better solve the problem of learning based on a small sample. Finally, three examples are provided to illustrate the feasibility and effectiveness of the proposed method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21994536
Volume :
10
Issue :
2
Database :
Complementary Index
Journal :
Complex & Intelligent Systems
Publication Type :
Academic Journal
Accession number :
176339017
Full Text :
https://doi.org/10.1007/s40747-023-01281-3