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TraModeAVTest: Modeling Scenario and Violation Testing for Autonomous Driving Systems Based on Traffic Regulations.

TraModeAVTest: Modeling Scenario and Violation Testing for Autonomous Driving Systems Based on Traffic Regulations.

Authors :
Xia, Chunyan
Huang, Song
Zheng, Changyou
Yang, Zhen
Bai, Tongtong
Sun, Lele
Source :
Electronics (2079-9292); Apr2024, Vol. 13 Issue 7, p1197, 22p
Publication Year :
2024

Abstract

Current testing methods for autonomous driving systems primarily focus on simple traffic scenarios, generating test cases based on traffic accidents, while research on generating edge test cases for complex driving environments by traffic regulations is not adequately comprehensive. Therefore, we propose a method for scenario modeling and violation testing using an autonomous driving system based on traffic regulations named TraModeAVTest. Initially, TraModeAVTest constructs a Petri net model for complex scenarios based on the combination relationships of basic traffic regulation scenarios and verifies the consistency of the model's design with traffic regulation requirements using formal methods, to provide a representation of traffic regulation scenario models for the violation testing of autonomous driving systems. Subsequently, based on the coverage criteria of the Petri net model, it utilizes a search strategy to generate model paths that represent traffic regulations, and employs a parameter combination method to generate test cases that cover the model paths, to test the violation behaviors of autonomous driving systems. Finally, simulation experiment results on the Baidu Apollo demonstrate that the test cases representing traffic regulations generated by TraModeAVTest can effectively identify the behaviors of autonomous vehicles violating traffic regulations, and TraModeAVTest can effectively improve the efficiency of generating different types of violation scenarios. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20799292
Volume :
13
Issue :
7
Database :
Complementary Index
Journal :
Electronics (2079-9292)
Publication Type :
Academic Journal
Accession number :
176594090
Full Text :
https://doi.org/10.3390/electronics13071197