Back to Search Start Over

Parameters and Composition of Plasma in a CF4 + H2 + Ar Mixture: Effect of CF4/H2 Ratio.

Authors :
Miakonkikh, A. V.
Kuzmenko, V. O.
Efremov, A. M.
Rudenko, K. V.
Source :
Russian Microelectronics; Feb2024, Vol. 53 Issue 1, p70-78, 9p
Publication Year :
2024

Abstract

The electrophysical parameters of the plasma and the kinetics of plasma-chemical processes in a CF<subscript>4</subscript> + H<subscript>2</subscript> + Ar mixture while varying the CF<subscript>4</subscript>/H<subscript>2</subscript> ratio are studied. When using diagnostic methods and plasma modeling together, it is found that replacing tetrafluoromethane with hydrogen (a) leads to a decrease in the plasma density and an increase in electronegativity; and (b) it causes a disproportionately sharp drop in the concentration of fluorine atoms. The reason for the latter effect is the increase in the frequency of the death of atoms in reactions of the CHF<subscript>x</subscript> + F → CF<subscript>x</subscript> + HF type initiated by heterogeneous recombination via the CF<subscript>x</subscript> + H → CHF<subscript>x</subscript> mechanism. The simultaneous increase in the concentration of polymer-forming CH<subscript>x</subscript>F<subscript>y</subscript> (x + y < 3) radicals indicates an increase in the polymerization load of the plasma on the surfaces in contact with it. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10637397
Volume :
53
Issue :
1
Database :
Complementary Index
Journal :
Russian Microelectronics
Publication Type :
Academic Journal
Accession number :
177043939
Full Text :
https://doi.org/10.1134/S1063739723600012