Knockout of GRAIN WIDTH2 has a dual effect on enhancing leaf rust resistance and increasing grain weight in wheat.

This article, published in the Plant Biotechnology Journal, discusses the discovery of a gene in wheat called GRAIN WIDTH2 (TaGW2) that has a dual effect on enhancing leaf rust resistance and increasing grain weight. Leaf rust, caused by the fungal pathogen Puccinia triticina Eriksson, is a major threat to global wheat production. The limited number of cloned resistance genes often have undesirable agronomic traits, so finding new resistance genes while balancing yield is important for breeding strategies. The researchers used CRISPR/Cas9 technology to edit TaGW2 and found that knockout plants had increased resistance to leaf rust and increased grain weight, offering a novel approach to enhancing wheat's resistance without sacrificing yield. [Extracted from the article]