Back to Search
Start Over
Domain Decomposition Hybrid Implicit–Explicit Algorithm with Higher-Order Perfectly Matched Layer Formulation for Electrical Performance Evaluation under Low-Pressure Discharge Phenomenon.
- Source :
- Electronics (2079-9292); Jun2024, Vol. 13 Issue 12, p2364, 16p
- Publication Year :
- 2024
-
Abstract
- Low-pressure discharge events have a major impact on a satellite's electrical performance. Most notably, a number of serious issues arise from the inability to directly modify satellite systems that operate in orbit. Accurate analysis of electrical performance is crucial for mitigating the issues arising from the low-pressure discharge phenomenon. Complex structures, such as intricate features and curved structures, are frequently used in satellite systems' enormous microwave components. In this case, the finite-difference time-domain (FDTD) approach proposes the hybrid implicit–explicit (HIE) algorithm with a domain decomposition method to effectively simulate complex structures under the low-pressure discharge phenomenon. The bilinear transform method is adjusted in accordance with the implicit equations for the anisotropic magnetized plasma environment caused by the discharge. To end unbounded lattices, a higher-order perfectly matched layer is used at the boundary. An example of a microwave connector structure is used to show how well the algorithm performs electrically. According to the findings, the suggested algorithm behaves in a way that is consistent with both the traditional algorithm and the experiments. Furthermore, the phenomenon of low-pressure discharge has a notable impact on the electrical performance of microwave components. [ABSTRACT FROM AUTHOR]
- Subjects :
- DOMAIN decomposition methods
ALGORITHMS
ORBITS (Astronomy)
Subjects
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 13
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Electronics (2079-9292)
- Publication Type :
- Academic Journal
- Accession number :
- 178154600
- Full Text :
- https://doi.org/10.3390/electronics13122364