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Machine Learning-Enabled Image Classification for Automated Electron Microscopy.

Authors :
Day, Alexandra L
Wahl, Carolin B
Gupta, Vishu
Reis, Roberto dos
Liao, Wei-keng
Mirkin, Chad A
Dravid, Vinayak P
Choudhary, Alok
Agrawal, Ankit
Source :
Microscopy & Microanalysis; Jun2024, Vol. 30 Issue 3, p456-465, 10p
Publication Year :
2024

Details

Language :
English
ISSN :
14319276
Volume :
30
Issue :
3
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
178338218
Full Text :
https://doi.org/10.1093/mam/ozae042