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Surface Defect Detection for Aerospace Aluminum Profiles with Attention Mechanism and Multi-Scale Features.

Authors :
Feng, Yin-An
Song, Wei-Wei
Source :
Electronics (2079-9292); Jul2024, Vol. 13 Issue 14, p2861, 13p
Publication Year :
2024

Abstract

A YOLOv5 aluminum profile defect detection algorithm that integrates attention and multi-scale features is proposed in this paper to address the issues of the low detection accuracy, high false detection rates, and high missed detection rates that are caused by the large-scale variation of surface defects, inconspicuous small defect characteristics, and a lack of concentrated feature information in defect areas. Firstly, an improved CBAM (Channel-Wise Attention Module) convolutional attention module is employed, which effectively focuses on the feature information of defect areas in the aluminum defect dataset with only a small amount of spatial dimension. Secondly, a bidirectional weighted feature fusion network is utilized, incorporating a multi-scale feature fusion network with skip connections to aggregate various high-resolution features, thus enriching the semantic expression of features. Then, new size feature maps that have not been fused are introduced into the detection layer network to improve the detection effect of small target defects. Experimental results indicate that an average detection accuracy (mAP) of 82.6% was achieved by the improved YOLOv5 algorithm on the aluminum surface defect dataset. An improvement of 6.2% over the previous version was observed. The current defect detection requirements of aluminum profile production sites are met by this enhanced algorithm. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20799292
Volume :
13
Issue :
14
Database :
Complementary Index
Journal :
Electronics (2079-9292)
Publication Type :
Academic Journal
Accession number :
178691782
Full Text :
https://doi.org/10.3390/electronics13142861