P‐93: Analysis and improvement of Dark‐Spot defects in TFT‐LCD.

In this paper, the mechanism of Dark‐Spot defect in thin film transistor liquid crystal display (TFT‐LCD) and its improvement measures are studied. The Dark‐Spot defect has a strong correlation with Polymer Film on Array (PFA) materials through stress analysis, and the defect can be reduced by a series of improvement we provided from PFA process adjusting and material formula optimizing. [ABSTRACT FROM AUTHOR]