Cite
P‐93: Analysis and improvement of Dark‐Spot defects in TFT‐LCD.
MLA
Li, Chunmei, et al. “P‐93: Analysis and Improvement of Dark‐Spot Defects in TFT‐LCD.” SID Symposium Digest of Technical Papers, vol. 55, no. 1, June 2024, pp. 1747–50. EBSCOhost, https://doi.org/10.1002/sdtp.17910.
APA
Li, C., Tang, M., Yu, C., Li, J., Chi, B., & Xu, H. (2024). P‐93: Analysis and improvement of Dark‐Spot defects in TFT‐LCD. SID Symposium Digest of Technical Papers, 55(1), 1747–1750. https://doi.org/10.1002/sdtp.17910
Chicago
Li, Chunmei, Min Tang, Chengzhong Yu, Ji Li, Baolin Chi, and Hongyuan Xu. 2024. “P‐93: Analysis and Improvement of Dark‐Spot Defects in TFT‐LCD.” SID Symposium Digest of Technical Papers 55 (1): 1747–50. doi:10.1002/sdtp.17910.