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Modification of the Properties of Titanium Carbide MXene by Ag Doping via Ion Implantation for Quantum Dot-Sensitized Solar Cell Applications.
- Source :
- Journal of Electronic Materials; Sep2024, Vol. 53 Issue 9, p5007-5017, 11p
- Publication Year :
- 2024
-
Abstract
- The current work investigates ion implantation of a transition metal (Ag) into MXene/TiO<subscript>2</subscript> films utilizing low energy at different fluence rates of 5 × 10<superscript>12</superscript>, 5 × 10<superscript>13</superscript>, 5 × 10<superscript>14</superscript>, and 5 × 10<superscript>15</superscript> ions-cm<superscript>−2</superscript> respectively. The morphology and crystal structure of the transition metal-implanted MXene/TiO<subscript>2</subscript> samples were characterized by field-emission scanning electron microscopy, x-ray diffraction, and Raman spectroscopy. In addition, x-ray photoelectron spectroscopy revealed the presence of Ag(I) oxidation state at 5 × 10<superscript>14</superscript> ions-cm<superscript>−2</superscript> fluence, whereas at a higher fluence of 5 × 10<superscript>15</superscript> ions-cm<superscript>−2</superscript>, both Ag(I) and Ag(0) states were found. The optical properties of the transition metal-implanted MXene/TiO<subscript>2</subscript> samples were also investigated via UV-visible and photoluminescence studies. The transition metal implantation significantly enhanced the light absorption and reduced the charge recombination owing to the formation of defect states. Finally, the quantum dot-sensitized solar cell (QDSSC) device fabricated with 5 × 10<superscript>14</superscript> ions-cm<superscript>−2</superscript> (Ag_3) exhibited the highest power conversion efficiency of 3.94% versus the unimplanted MXene/TiO<subscript>2</subscript>-based QDSSC (2.48%), which is attributed to enhanced absorption and minimization of charge recombinations, as confirmed by photovoltaic characteristics and Nyquist plots. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 03615235
- Volume :
- 53
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Journal of Electronic Materials
- Publication Type :
- Academic Journal
- Accession number :
- 178774739
- Full Text :
- https://doi.org/10.1007/s11664-024-11063-3