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Investigation of Piezoelectric Properties of Wurtzite AlN Films under In-Plane Strain: A First-Principles Study.
- Source :
- Coatings (2079-6412); Aug2024, Vol. 14 Issue 8, p984, 11p
- Publication Year :
- 2024
-
Abstract
- This research article presents a comprehensive first-principles study on the piezoelectric properties of Wurtzite Aluminum Nitride (AlN) films under in-plane strain conditions. By calculating the piezoelectric tensor coefficients (e33, e31, and e15), we investigate the variation patterns of these constants with respect to in-plane strain. Our results indicate significant changes in the piezoelectric constants within the range of in-plane strain considered, exhibiting a linear trend despite opposite trends for e33 compared to e31 and e15. This study highlights the extreme sensitivity of AlN films' piezoelectric performance to in-plane strain, suggesting its potential as an effective means for tuning and optimizing the piezoelectric properties of AlN-based devices. [ABSTRACT FROM AUTHOR]
- Subjects :
- ALUMINUM nitride
PSEUDOPOTENTIAL method
THIN films
WURTZITE
Subjects
Details
- Language :
- English
- ISSN :
- 20796412
- Volume :
- 14
- Issue :
- 8
- Database :
- Complementary Index
- Journal :
- Coatings (2079-6412)
- Publication Type :
- Academic Journal
- Accession number :
- 179349415
- Full Text :
- https://doi.org/10.3390/coatings14080984