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Reliability analysis of PV array or modules with supercapacitor based measurement techniques.

Authors :
Majumdar, Debashis
Basu Pal, Sudipta
Ganguly, Rajiv
Das Bhattacharya, Konika
Chanda, Chandan Kumar
Source :
Microsystem Technologies; Sep2024, Vol. 30 Issue 9, p1191-1200, 10p
Publication Year :
2024

Abstract

Physical and/or chemical changes in various module components frequently cause the electrical performance of PV modules to degrade, preventing them from operating at their peak potential. When PV producers choose the technology for their PV modules, reliability estimation of the modules is a key consideration. We never get actual PV power output as per the manufacturer's datasheet. It is simply because of degradation and some climatological parameters. So, reliability estimation is always an important task for PV scientists. In this research paper, the authors have performed a reliability analysis based on some figures of merits such as Fill Factor (FF), Efficiency, and regression analysis of different parameters. We usually do not get the actual PV power as per the manufacturer's specification, this happens the change in electrical parameters and external climatologically parameters degradation, which is a function of the internal electrical parameters or figures of merit. As a result, reliability estimation becomes a crucial duty for scientists to complete the data that may be provided to users. Since poly-Si technology for PV modules has been proven to be reliable in the eastern region, a study has been conducted in this work to evaluate the degradation by analyzing the values of various electrical parameters. The unique contribution of this research work has been that instead of other loading techniques in this research work authors have used the supercapacitor-based loading mechanisms. The primary focus of this research is on the performance assessment of poly-Si PV modules that were deployed in the Eastern Indian Climatic Zone under various environmental circumstances. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09467076
Volume :
30
Issue :
9
Database :
Complementary Index
Journal :
Microsystem Technologies
Publication Type :
Academic Journal
Accession number :
179357100
Full Text :
https://doi.org/10.1007/s00542-023-05606-7