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Global Quality of Service (QoX) Management for Wireless Networks.
- Source :
- Electronics (2079-9292); Aug2024, Vol. 13 Issue 16, p3113, 30p
- Publication Year :
- 2024
-
Abstract
- In the fast-changing technological landscape, novel applications are emerging with the potential to reshape the world. These applications, while promising, impose stringent requirements in terms of quality of service (QoS). The advent of wireless networks like 5G, 6G and Wi-Fi 6 brings about resource management solutions to ensure these requirements while meeting the user expectations within the interconnected environment. Nevertheless, user behaviors are also evolving, highlighting the importance of satisfaction and quality of experience (QoE). Furthermore, changes in user behavior trigger shifts in business models, where the quality of business (QoBiz) takes on a pivotal role. This evolving ecosystem, encompassing QoS, QoE, and QoBiz, demands a comprehensive and adaptable approach that conventional QoS management frameworks fail to perform. This paper introduces an implementation methodology for a global QoS management model named QoXphere. The implementation methodology is grounded in machine learning techniques and addresses the multifaceted aspects of quality of service (QoX) and their interconnections within wireless networks. The objective is to facilitate dynamic resource management that not only elevates user satisfaction but also optimizes provider benefits. Real-world examples illustrate the methodology's applicability in widely deployed networks, complemented by simulated scenarios of modern network environments that further validate the approach. [ABSTRACT FROM AUTHOR]
- Subjects :
- MACHINE learning
QUALITY of service
SATISFACTION
5G networks
RESOURCE management
Subjects
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 13
- Issue :
- 16
- Database :
- Complementary Index
- Journal :
- Electronics (2079-9292)
- Publication Type :
- Academic Journal
- Accession number :
- 179382882
- Full Text :
- https://doi.org/10.3390/electronics13163113