DynER: Optimized Test Case Generation for Representational State Transfer (REST)ful Application Programming Interface (API) Fuzzers Guided by Dynamic Error Responses.

MLA

Chen, Juxing, et al. “DynER: Optimized Test Case Generation for Representational State Transfer (REST)Ful Application Programming Interface (API) Fuzzers Guided by Dynamic Error Responses.” Electronics (2079-9292), vol. 13, no. 17, Sept. 2024, p. 3476. EBSCOhost, https://doi.org/10.3390/electronics13173476.

APA

Chen, J., Chen, Y., Pan, Z., Chen, Y., Li, Y., Li, Y., Zhang, M., & Shen, Y. (2024). DynER: Optimized Test Case Generation for Representational State Transfer (REST)ful Application Programming Interface (API) Fuzzers Guided by Dynamic Error Responses. Electronics (2079-9292), 13(17), 3476. https://doi.org/10.3390/electronics13173476

Chicago

Chen, Juxing, Yuanchao Chen, Zulie Pan, Yu Chen, Yuwei Li, Yang Li, Min Zhang, and Yi Shen. 2024. “DynER: Optimized Test Case Generation for Representational State Transfer (REST)Ful Application Programming Interface (API) Fuzzers Guided by Dynamic Error Responses.” Electronics (2079-9292) 13 (17): 3476. doi:10.3390/electronics13173476.