Time-resolved cathodoluminescence measurement of the effects of α-particle-related damage on minority hole lifetime in free-standing n-GaN.

MLA

Larkin, L. S., et al. “Time-Resolved Cathodoluminescence Measurement of the Effects of α-Particle-Related Damage on Minority Hole Lifetime in Free-Standing n-GaN.” Applied Physics Letters, vol. 125, no. 15, Oct. 2024, pp. 1–6. EBSCOhost, https://doi.org/10.1063/5.0231846.

APA

Larkin, L. S., Ji, M., Garrett, G. A., Parameshwaran, V., Demaree, J. D., Litz, M. S., & Wraback, M. (2024). Time-resolved cathodoluminescence measurement of the effects of α-particle-related damage on minority hole lifetime in free-standing n-GaN. Applied Physics Letters, 125(15), 1–6. https://doi.org/10.1063/5.0231846

Chicago

Larkin, L. S., M. Ji, G. A. Garrett, V. Parameshwaran, J. D. Demaree, M. S. Litz, and M. Wraback. 2024. “Time-Resolved Cathodoluminescence Measurement of the Effects of α-Particle-Related Damage on Minority Hole Lifetime in Free-Standing n-GaN.” Applied Physics Letters 125 (15): 1–6. doi:10.1063/5.0231846.