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Nonchemically amplified molecular resist based on multi-sulfonium modified triptycene for electron beam and extreme ultraviolet lithography.

Authors :
Yuan, Xiaodong
Chen, Jinping
Yu, Tianjun
Zeng, Yi
Guo, Xudong
Wang, Shuangqing
Hu, Rui
Tian, Peng
Vockenhuber, Michaela
Kazazis, Dimitrios
Ekinci, Yasin
Zhao, Jun
Wu, Yanqing
Yang, Guoqiang
Li, Yi
Source :
Journal of Micro/Nanopatterning, Materials & Metrology (JM3); Jul-Sep2024, Vol. 23 Issue 3, p34601-34601, 1p
Publication Year :
2024

Details

Language :
English
ISSN :
27088340
Volume :
23
Issue :
3
Database :
Complementary Index
Journal :
Journal of Micro/Nanopatterning, Materials & Metrology (JM3)
Publication Type :
Academic Journal
Accession number :
180298235
Full Text :
https://doi.org/10.1117/1.JMM.23.3.034601