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STRUCTURAL, DIELECTRIC AND MAGNETIC PROPERTIES OF EPITAXIAL GROWN YMn0.5Cr0.5O3 THIN FILMS.

Authors :
Rambabu, A.
Mounika, G. Jeevana
Jayadev, K.
Sridhar, B.
Source :
East European Journal of Physics; 2024, Issue 4, p274-278, 5p
Publication Year :
2024

Abstract

YCr<subscript>(1-x)</subscript>MnxO<subscript>3</subscript> is an intriguing member of the perovskite family, attracting significant interest due to its versatile properties and potential applications in various fields. Epitaxial orthorhombic YMn<subscript>0.5</subscript>Cr<subscript>0.5</subscript>O<subscript>3</subscript> films are grown on STO substrates by pulsed laser deposition method. Well crystalline with (0 ℓ 0) orientation of YMn<subscript>0.5</subscript>Cr<subscript>0.5</subscript>O<subscript>3</subscript> films are identified by X-ray diffraction. Field emission scanning electron microscopy used to capture the morphological behavior of crystalline YMn<subscript>0.5</subscript>Cr<subscript>0.5</subscript>O<subscript>3</subscript> films. Temperature dependent dielectric properties are analyzed thoroughly. The magnetic properties of YMn<subscript>0.5</subscript>Cr<subscript>0.5</subscript>O<subscript>3</subscript> films are characterized using physical property measurement system. There is a clear magnetic transition observed around 60K for three YMn<subscript>0.5</subscript>Cr<subscript>0.5</subscript>O<subscript>3</subscript> films. Films deposited at 600oC exhibited high dielectric and magnetic properties. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
23124334
Issue :
4
Database :
Complementary Index
Journal :
East European Journal of Physics
Publication Type :
Academic Journal
Accession number :
181590619
Full Text :
https://doi.org/10.26565/2312-4334-2024-4-28