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Displacement damage effects in MoS2-based electronics.
- Source :
- Journal of Semiconductors; Dec2024, Vol. 45 Issue 12, p1-7, 7p
- Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 16744926
- Volume :
- 45
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Journal of Semiconductors
- Publication Type :
- Academic Journal
- Accession number :
- 182079896
- Full Text :
- https://doi.org/10.1088/1674-4926/24090027