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An Automated and Efficient Substrate Noise Analysis Tool.
- Source :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Mar2006, Vol. 25 Issue 3, p434-468, 15p, 5 Black and White Photographs, 16 Graphs
- Publication Year :
- 2006
-
Abstract
- This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green's function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 25
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 20054636
- Full Text :
- https://doi.org/10.1109/TCAD.2005.854628