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Influence of annealing temperature on the band structure of sol-gel Ba0.65Sr0.35TiO3 thin films on n-type Si(100).

Authors :
Lu, H.
Pan, J. S.
Chen, X. F.
Zhu, W. G.
Tan, O. K.
Source :
Applied Physics Letters; 3/27/2006, Vol. 88 Issue 13, p132907, 3p, 1 Chart, 4 Graphs
Publication Year :
2006

Abstract

The annealing temperature effect on the band structure of Ba<subscript>0.65</subscript>Sr<subscript>0.35</subscript>TiO<subscript>3</subscript> (BST) thin films coated on n-type Si(100) substrate was investigated by ellipsometry and x-ray photoelectron spectroscopy. The band energy shifts of sol-gel BST films annealed at different temperatures are dependent on their developed microstructure. Related to the amorphous BST films annealed at 600 °C, the polycrystalline BST film annealed at 700 °C exhibits narrow band gap, upwards-moved Fermi level, and downwards-moved conduction band minimum, which are believed to contribute the enhanced field emission of BST-coated Si field emitter arrays. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
88
Issue :
13
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
20735856
Full Text :
https://doi.org/10.1063/1.2189828