Epitaxially grown WOx nanorod probes for sub-100 nm multiple-scanning-probe measurement.

Authors :: Kubo, O.
Shingaya, Y.
Nakaya, M.
Aono, M.
Nakayama, T.
Source :: Applied Physics Letters; 6/19/2006, Vol. 88 Issue 25, p254101, 3p, 1 Black and White Photograph, 2 Diagrams, 1 Graph
Publication Year :: 2006
Abstract: Tungsten suboxide (WO<subscript>x</subscript>) nanorods that are directly grown on electrochemically etched tungsten (W) tips are used as probes of a double-scanning-probe tunneling microscope. A WO<subscript>x</subscript> nanorod well acts as a scanning probe in tunneling microscopy and stable atomic-scale imaging is confirmed. For a contact nanoelectrode in measuring electrical properties of nanostructures, the WO<subscript>x</subscript> nanorod probe is coated with platinum. A series of resistance measurements of an erbium-disilicide nanowire as a function of interprobe distance down to 72 nm is realized. [ABSTRACT FROM AUTHOR]

Subjects :: TUNGSTEN
CHROMIUM group
OPTICAL instruments
MICROSCOPY
NANOSTRUCTURES
PHYSICS

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