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Silicon resonant microcantilevers for absolute pressure measurement.

Authors :
Bianco, S.
Cocuzza, M.
Ferrero, S.
Giuri, E.
Piacenza, G.
Pirri, C. F.
Ricci, A.
Scaltrito, L.
Bich, D.
Merialdo, A.
Schina, P.
Correale, R.
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; Jul/Aug2006, Vol. 24 Issue 4, p1803-1809, 7p, 1 Black and White Photograph, 1 Diagram, 6 Graphs
Publication Year :
2006

Abstract

This work is focused on the developing of silicon resonant microcantilevers for the measurement of the absolute pressure. The microcantilevers have been fabricated with a two-mask bulk micromachining process. The variation in resonance response of microcantilevers was investigated as a function of pressure (10<superscript>-1</superscript>–10<superscript>5</superscript> Pa), both in terms of resonance frequency and quality factor. A theoretical description of the resonating microstructure is given according to different molecular and viscous regimes. Also a brief discussion on the different quality factors contributions is presented. Theoretical and experimental data show a very satisfying agreement. The microstructure behavior demonstrates a certain sensitivity over a six decade range and the potential evolution of an absolute pressure sensor working in the same range. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10711023
Volume :
24
Issue :
4
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
Publication Type :
Academic Journal
Accession number :
23074168
Full Text :
https://doi.org/10.1116/1.2214698