Back to Search
Start Over
Silicon resonant microcantilevers for absolute pressure measurement.
- Source :
- Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; Jul/Aug2006, Vol. 24 Issue 4, p1803-1809, 7p, 1 Black and White Photograph, 1 Diagram, 6 Graphs
- Publication Year :
- 2006
-
Abstract
- This work is focused on the developing of silicon resonant microcantilevers for the measurement of the absolute pressure. The microcantilevers have been fabricated with a two-mask bulk micromachining process. The variation in resonance response of microcantilevers was investigated as a function of pressure (10<superscript>-1</superscript>–10<superscript>5</superscript> Pa), both in terms of resonance frequency and quality factor. A theoretical description of the resonating microstructure is given according to different molecular and viscous regimes. Also a brief discussion on the different quality factors contributions is presented. Theoretical and experimental data show a very satisfying agreement. The microstructure behavior demonstrates a certain sensitivity over a six decade range and the potential evolution of an absolute pressure sensor working in the same range. [ABSTRACT FROM AUTHOR]
- Subjects :
- SILICON
PRESSURE
MICROSTRUCTURE
DETECTORS
MICROMACHINING
Subjects
Details
- Language :
- English
- ISSN :
- 10711023
- Volume :
- 24
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
- Publication Type :
- Academic Journal
- Accession number :
- 23074168
- Full Text :
- https://doi.org/10.1116/1.2214698