Structure inhomogeneities, shallow defects, and charge transport in the series of thermoelectric materials K2Bi8-xSbxSe13.

MLA

Kyratsi, Theodora, et al. “Structure Inhomogeneities, Shallow Defects, and Charge Transport in the Series of Thermoelectric Materials K2Bi8-XSbxSe13.” Journal of Applied Physics, vol. 100, no. 12, Dec. 2006, p. 123704. EBSCOhost, https://doi.org/10.1063/1.2365718.

APA

Kyratsi, T., Hatzikraniotis, E., Paraskevopoulos, K. M., Malliakas, C. D., Dyck, J. S., Uher, C., & Kanatzidis, M. G. (2006). Structure inhomogeneities, shallow defects, and charge transport in the series of thermoelectric materials K2Bi8-xSbxSe13. Journal of Applied Physics, 100(12), 123704. https://doi.org/10.1063/1.2365718

Chicago

Kyratsi, Theodora, Euripides Hatzikraniotis, Konstantinos M. Paraskevopoulos, Christos D. Malliakas, Jeff S. Dyck, Ctirad Uher, and Mercouri G. Kanatzidis. 2006. “Structure Inhomogeneities, Shallow Defects, and Charge Transport in the Series of Thermoelectric Materials K2Bi8-XSbxSe13.” Journal of Applied Physics 100 (12): 123704. doi:10.1063/1.2365718.