Thickness dependence of in-plane dielectric and ferroelectric properties of Ba0.7Sr0.3TiO3 thin films epitaxially grown on LaAlO3.

MLA

Zhou, X. Y., et al. “Thickness Dependence of In-Plane Dielectric and Ferroelectric Properties of Ba0.7Sr0.3TiO3 Thin Films Epitaxially Grown on LaAlO3.” Applied Physics Letters, vol. 90, no. 13, Mar. 2007, pp. 132902–1. EBSCOhost, https://doi.org/10.1063/1.2716865.

APA

Zhou, X. Y., Wang, D. Y., Zheng, R. K., Tian, H. Y., Qi, J. Q., Chan, H. L. W., Choy, C. L., & Wang, Y. (2007). Thickness dependence of in-plane dielectric and ferroelectric properties of Ba0.7Sr0.3TiO3 thin films epitaxially grown on LaAlO3. Applied Physics Letters, 90(13), 132902–1. https://doi.org/10.1063/1.2716865

Chicago

Zhou, X. Y., D. Y. Wang, R. K. Zheng, H. Y. Tian, J. Q. Qi, H. L. W. Chan, C. L. Choy, and Y. Wang. 2007. “Thickness Dependence of In-Plane Dielectric and Ferroelectric Properties of Ba0.7Sr0.3TiO3 Thin Films Epitaxially Grown on LaAlO3.” Applied Physics Letters 90 (13): 132902–1. doi:10.1063/1.2716865.