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Reliability of Active-Matrix Organic Light-Emitting-Diode Arrays With Amorphous Silicon Thin-Film Transistor Backplanes on Clear Plastic.

Authors :
Hekmatshoar, Bahman
Kattamis, Alex Z.
Cherenack, Kunigunde H.
Ke Long
Jian-Zhang Chen
Wagner, Sigurd
Sturm, James C.
Rajan, Kamala
Hack, Michael
Source :
IEEE Electron Device Letters; Jan2008, Vol. 29 Issue 1, p63-66, 4p, 3 Graphs
Publication Year :
2008

Abstract

We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 °C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07413106
Volume :
29
Issue :
1
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
28464145
Full Text :
https://doi.org/10.1109/LED.2007.910800