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Dependence of Ferroelectric and Magnetic Properties on Measuring Temperatures for Polycrystalline BiFeO3 Films.

Authors :
Naganuma, Hiroshi
Inoue, Yosuke
Okamura, Soichiro
Source :
IEEE Transactions on Ultrasonics Ferroelectrics & Frequency Control; May2008, Vol. 55 Issue 5, p1046-1050, 5p, 3 Black and White Photographs, 6 Graphs
Publication Year :
2008

Abstract

A multiferroic BiFeO<subscript>3</subscript> film was fabricated on a Pt/Ti/SiO<subscript>2</subscript>/Si(100) substrate by a chemical solution de- position (CSD) method, and this was followed by postdeposition annealing at 923 K for 10 mm in air. X-ray diffraction analysis indicated the formation of the polycrystalliae single phase of the BiFeO<subscript>3</subscript> film. A high remanent polarization of 89 µC/cm² was observed at 90 K together with a relatively low electric coercive field of 0.32 MV/cm, although the ferroelectric hysteresis loops could not be observed at room temperature due to a high leakage current density. The temperature dependence of the ferroelectric hysteresis loops indicated that these hysteresis loops lose their shape above 165 K, and the nominal remanent polarization drastically increased due to the leakage current. Magnetic measurements indicated that the saturation magnetization was less than 1 emu/cm³ at room temperature and increased to approximately 2 emu/cm³ at 100 K, although the spontaneous magnetization could not appear. The magnetization curves of polycrystalline BiFeO<subscript>3</subscript> film were nonlinear at both temperatures, which is different with BiFeO<subscript>3</subscript> single crystal. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08853010
Volume :
55
Issue :
5
Database :
Complementary Index
Journal :
IEEE Transactions on Ultrasonics Ferroelectrics & Frequency Control
Publication Type :
Academic Journal
Accession number :
32157388
Full Text :
https://doi.org/10.1109/TUFFC.2008.754