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Multiple-Instance Learning Via Random Walk.

Authors :
Fürnkranz, Johannes
Scheffer, Tobias
Spiliopoulou, Myra
Dong Wang
Jianmin Li
Bo Zhang
Source :
Machine Learning: ECML 2006; 2006, p473-484, 12p
Publication Year :
2006

Abstract

This paper presents a decoupled two stage solution to the multiple-instance learning (MIL) problem. With a constructed affinity matrix to reflect the instance relations, a modified Random Walk on a Graph process is applied to infer the positive instances in each positive bag. This process has both a closed form solution and an efficient iterative one. Combined with the Support Vector Machine (SVM) classifier, this algorithm decouples the inferring and training stages and converts MIL into a supervised learning problem. Compared with previous algorithms on several benchmark data sets, the proposed algorithm is quite competitive in both computational efficiency and classification accuracy. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9783540453758
Database :
Complementary Index
Journal :
Machine Learning: ECML 2006
Publication Type :
Book
Accession number :
32905635
Full Text :
https://doi.org/10.1007/11871842_45