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Thermoplasmonic shift and dispersion in thin metal films.

Authors :
Lereu, A. L.
Passian, A.
Farahi, R. H.
van Hulst, N. F.
Ferrell, T. L.
Thundat, T.
Source :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2008, Vol. 26 Issue 4, p836-841, 6p, 1 Diagram, 6 Graphs
Publication Year :
2008

Abstract

In 2004, the authors reported two coupling schemes based on the thermo-optic properties of thin metallic films and their associated sub- and superstrates, by utilizing surface plasmons. These studies showed a potential for all-optical modulation at low rates that may be used for sensing purposes. In this article, they continue by investigating thermal processes involved in thin metallic films with different approaches. They first experimentally imaged the shift of the surface plasmon dispersion relation in the visible spectrum, as the thin film temperature is externally varied. They then reinforce the previous observations by collecting the absorption curves at selected visible photon energies of excitation, as the film temperature in the excitation region increases. Utilizing the absorption measurements, they briefly address how one may obtain the real and imaginary parts of the index of refraction of the thin film as a function of temperature for each involved wavelength. Finally, they investigate the local physical state of the film by optically profiling the surface plasmon excitation region. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07342101
Volume :
26
Issue :
4
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
Publication Type :
Academic Journal
Accession number :
34360882
Full Text :
https://doi.org/10.1116/1.2900713