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Modeling of Recombination in HgCdTe.

Authors :
GREIN, C. H.
FLATTÉ, M. E.
YONG CHANG
Source :
Journal of Electronic Materials; Sep2008, Vol. 37 Issue 9, p1415-1419, 5p, 5 Graphs
Publication Year :
2008

Abstract

Minority carrier recombination lifetime calculations for narrow-gap semiconductors are of direct practical interest in establishing whether a material's recombination is extrinsically or intrinsically limited, and therefore in guiding research and development programs regarding material quality improvements. We describe efforts to obtain accurate electronic band structures of HgCdTe alloy-based materials with infrared energy gaps and employ them to evaluate Auger recombination lifetimes. We use a 14-band k · p formalism to compute and optimize electronic band structures, and use the obtained electronic energies and matrix elements directly in the numerical evaluation of Auger and radiative lifetimes. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
37
Issue :
9
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
34505918
Full Text :
https://doi.org/10.1007/s11664-008-0417-4