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Modeling of Recombination in HgCdTe.
- Source :
- Journal of Electronic Materials; Sep2008, Vol. 37 Issue 9, p1415-1419, 5p, 5 Graphs
- Publication Year :
- 2008
-
Abstract
- Minority carrier recombination lifetime calculations for narrow-gap semiconductors are of direct practical interest in establishing whether a material's recombination is extrinsically or intrinsically limited, and therefore in guiding research and development programs regarding material quality improvements. We describe efforts to obtain accurate electronic band structures of HgCdTe alloy-based materials with infrared energy gaps and employ them to evaluate Auger recombination lifetimes. We use a 14-band k · p formalism to compute and optimize electronic band structures, and use the obtained electronic energies and matrix elements directly in the numerical evaluation of Auger and radiative lifetimes. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 03615235
- Volume :
- 37
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Journal of Electronic Materials
- Publication Type :
- Academic Journal
- Accession number :
- 34505918
- Full Text :
- https://doi.org/10.1007/s11664-008-0417-4