Back to Search
Start Over
Dielectric constant at x-band microwave frequencies for multiferroic BiFeO3 thin films.
- Source :
- Journal of Applied Physics; Apr2009, Vol. 105 Issue 7, p07D912-07D912-3, 3p, 2 Charts, 5 Graphs
- Publication Year :
- 2009
-
Abstract
- The magnetic-induced dielectric responses of BiFeO<subscript>3</subscript> (BFO) thin films were measured at the X-band microwave frequency ranged from 7 to 12.5 GHz. The measurement was given initially by a high-precision cavity microwave resonator without magnetic field. Both the real and imaginary parts of the permittivity showed its dielectric property as a function of the measuring frequency. The X-band dielectric responses of the BFO thin film were then measured by a controlled magnetic field at room temperature. The data demonstrated up to 2.2% dielectric tunability by using only 3.46 kOe magnetic field at TE<subscript>107</subscript> mode (9.97705 GHz). [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 105
- Issue :
- 7
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 37610819
- Full Text :
- https://doi.org/10.1063/1.3068477