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A low-temperature method for improving the performance of sputter-deposited ZnO thin-film transistors with supercritical fluid.

Authors :
Chen, Min-Chen
Chang, Ting-Chang
Huang, Sheng-Yao
Chang, Kuan-Chang
Li, Hung-Wei
Chen, Shih-Ching
Lu, Jin
Shi, Yi
Source :
Applied Physics Letters; 4/20/2009, Vol. 94 Issue 16, p162111, 3p, 1 Chart, 3 Graphs
Publication Year :
2009

Abstract

A low-temperature method, supercritical CO<subscript>2</subscript> (SCCO<subscript>2</subscript>) fluid technology, is employed to improve the device properties of ZnO TFT at 150 °C. In this work, the undoped ZnO films were deposited by sputter at room temperature and treated by SCCO<subscript>2</subscript> fluid which is mixed with 5 ml pure H<subscript>2</subscript>O. After SCCO<subscript>2</subscript> treatment, the on/off current ratios and threshold voltage of the device were improved significantly. From x-ray photoelectron spectroscopy analyses, the enhancements were attributed to the stronger Zn–O bonds, the hydrogen-related donors, and the reduction in dangling bonds at the grain boundary by OH passivation. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
94
Issue :
16
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
38225272
Full Text :
https://doi.org/10.1063/1.3124658