Back to Search
Start Over
Interface study of Nb/ZrO[sub x]-Zr/Nb Josephson junctions.
- Source :
- Applied Physics Letters; 9/13/1993, Vol. 63 Issue 11, p1570, 3p, 5 Graphs
- Publication Year :
- 1993
-
Abstract
- Presents an interface study of Nb/ZrO[sub x]-Zr/Nb Josephson junctions by using the secondary ion mass spectroscopy. Detachment of water vapor layer from the chamber wall; Absorption of argon sputtering gas in the ZrO[sub x]-Zr and niobium layers; Implication of zirconium melting point for the junction interface stability.
- Subjects :
- JOSEPHSON junctions
SECONDARY ion mass spectrometry
ZIRCONIUM
NIOBIUM
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 63
- Issue :
- 11
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4221457
- Full Text :
- https://doi.org/10.1063/1.110752