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A high resolution pulsed field ionization photoelectron study of O[sub 2] using third generation...

Authors :
Hsu, C.-W.
Heimann, P.
Evans, M.
Stimson, S.
Fenn, P.T.
Ng, C.Y.
Source :
Journal of Chemical Physics; 6/1/1997, Vol. 106 Issue 21, p8931, 4p, 1 Chart, 4 Graphs
Publication Year :
1997

Abstract

Improves a newly developed experimental scheme for high resolution pulsed field ionization photoelectron (PFI-PE) studies of oxygen using the high resolution monochromatized multibunch undulator synchroton of the chemical dynamics beamline at the advanced light source. Advantage of the scheme for PFI-PE measurements to have no contamination by background electrons.

Details

Language :
English
ISSN :
00219606
Volume :
106
Issue :
21
Database :
Complementary Index
Journal :
Journal of Chemical Physics
Publication Type :
Academic Journal
Accession number :
4283789
Full Text :
https://doi.org/10.1063/1.473956