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Search for free holes in InN:Mg-interplay between surface layer and Mg-acceptor doped interior.
- Source :
- Journal of Applied Physics; Jun2009, Vol. 105 Issue 12, p123713-1-123713-5, 5p, 1 Diagram, 2 Charts, 4 Graphs
- Publication Year :
- 2009
-
Abstract
- We measured lateral ac transport (up to 20 MHz), thermopower, as well as resistivity and Hall effect in InN:Mg samples with various Mg content. The sign of the Hall effect for all the samples was negative (electrons), however, the thermopower (α) measurements have shown the p-type sign of α for moderate Mg content—in the window centered around 1×10<superscript>19</superscript> cm<superscript>-3</superscript>. Further overdoping with Mg yields donor type of defects and the change of thermoelectric power sign. The ac measurements performed as a function of frequency revealed that in both samples exhibiting and nonexhibiting p-type sign of thermopower, the n-type inversion layer at the surface does not prevent the electric contact to the bulk layer. Therefore we conclude that the n-type Hall effect invariably reported for all the Mg-doped samples originates from electron domination in mobility-weighted contributions of both types of carriers. [ABSTRACT FROM AUTHOR]
- Subjects :
- SEMICONDUCTOR doping
INDIUM
NITRIDES
MAGNESIUM
HALL effect
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 105
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 42961697
- Full Text :
- https://doi.org/10.1063/1.3153942