Back to Search Start Over

Search for free holes in InN:Mg-interplay between surface layer and Mg-acceptor doped interior.

Authors :
Dmowski, L. H.
Baj, M.
Suski, T.
Przybytek, J.
Czernecki, R.
Wang, X.
Yoshikawa, A.
Lu, H.
Schaff, W. J.
Muto, D.
Nanishi, Y.
Source :
Journal of Applied Physics; Jun2009, Vol. 105 Issue 12, p123713-1-123713-5, 5p, 1 Diagram, 2 Charts, 4 Graphs
Publication Year :
2009

Abstract

We measured lateral ac transport (up to 20 MHz), thermopower, as well as resistivity and Hall effect in InN:Mg samples with various Mg content. The sign of the Hall effect for all the samples was negative (electrons), however, the thermopower (α) measurements have shown the p-type sign of α for moderate Mg content—in the window centered around 1×10<superscript>19</superscript> cm<superscript>-3</superscript>. Further overdoping with Mg yields donor type of defects and the change of thermoelectric power sign. The ac measurements performed as a function of frequency revealed that in both samples exhibiting and nonexhibiting p-type sign of thermopower, the n-type inversion layer at the surface does not prevent the electric contact to the bulk layer. Therefore we conclude that the n-type Hall effect invariably reported for all the Mg-doped samples originates from electron domination in mobility-weighted contributions of both types of carriers. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
105
Issue :
12
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
42961697
Full Text :
https://doi.org/10.1063/1.3153942