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Fabrication of Josephson junctions using an Al/Ta/Nb structure for x-ray detection.
- Source :
- Applied Physics Letters; 2/7/1994, Vol. 64 Issue 6, p785, 3p, 3 Black and White Photographs, 6 Diagrams
- Publication Year :
- 1994
-
Abstract
- Examines the fabrication of Josephson junction using Al/Ta/Nb structure for x-ray detection. Application of the junctions for integrated circuits; Use of niobium layer as buffer; Temperature dependence of current-voltage characteristics.
- Subjects :
- JOSEPHSON junctions
X-rays
INTEGRATED circuits
NIOBIUM
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 64
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4319425
- Full Text :
- https://doi.org/10.1063/1.111013