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Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers.
- Source :
- Journal of Chemical Physics; 7/8/1997, Vol. 107 Issue 2, p645, 8p, 1 Diagram, 3 Charts, 13 Graphs
- Publication Year :
- 1997
-
Abstract
- Reports on the use of specular x-ray reflectivity to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane self-assembly technique that is repeated to form periodic multilayers. Increase in the film thickness as a function of the number of trilayers; Bragg peaks corresponding to the inter-trilayer spacing.
- Subjects :
- SPECULAR reflectance
MONOMOLECULAR films
SILOXANES
Subjects
Details
- Language :
- English
- ISSN :
- 00219606
- Volume :
- 107
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Journal of Chemical Physics
- Publication Type :
- Academic Journal
- Accession number :
- 4374697
- Full Text :
- https://doi.org/10.1063/1.474425