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Degradation Characteristics of YBCO-Coated Conductors Subjected to Overcurrent Pulse.

Authors :
Ishiyama, Atsushi
Nishio, Yukiyasu
Ueda, Hiroshi
Kashima, Naoji
Mori, Masami
Watanabe, Tomonori
Nagaya, Shigeo
Yagi, Masashi
Mukoyama, Shinichi
Machi, Takato
Shiohara, Yuh
Source :
IEEE Transactions on Applied Superconductivity; Jun2009 Part 3 of 3, Vol. 19 Issue 3, p3483-3486, 4p, 1 Diagram, 1 Chart, 5 Graphs
Publication Year :
2009

Abstract

YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good J<subscript>c</subscript> characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These over-currents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such over-current pulses. We carried out preliminary experiments on damage caused by over-current pulse drive, focusing on the temperature limitation without suffering degradation for over-current pulse operation. A 10-mm-wide YECO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Over-current tests were carried out on these sample tapes and I<subscript>c</subscript> degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the over-current drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10518223
Volume :
19
Issue :
3
Database :
Complementary Index
Journal :
IEEE Transactions on Applied Superconductivity
Publication Type :
Academic Journal
Accession number :
43892086
Full Text :
https://doi.org/10.1109/TASC.2009.2018734