Back to Search
Start Over
Electronic properties of the diamond films with nitrogen impurities: An x-ray absorption and photoemission spectroscopy study.
- Source :
- Applied Physics Letters; 12/25/2000, Vol. 77 Issue 26
- Publication Year :
- 2000
-
Abstract
- X-ray absorption near-edge structure (XANES) measurements have been performed for nitrogen (N) containing diamond films with three different N concentrations at the C K-edge using the sample drain current mode. The C K-edge XANES spectra of these diamond films resemble that of the pure diamond regardless of the N concentration, which suggests that the overall bonding configuration of the C atom is unaltered. N impurities are found to reduce the intensities of both the sp[sup 2]- and sp[sup 3]-bond derived resonance features in the XANES spectra. The valence-band photoelectron spectra indicate that N atoms cause the broadening of the valence band σ- and π-bond features and the enhancement and reduction of the σ- and π-bond features, respectively. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR]
- Subjects :
- NITROGEN
THIN films
X-ray absorption near edge structure
PHOTOELECTRON spectroscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 77
- Issue :
- 26
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4414846
- Full Text :
- https://doi.org/10.1063/1.1334916