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A Silicon d-spacing Mapping Measurement System With Resolution of 10-9.
- Source :
- AIP Conference Proceedings; 6/24/2010, Vol. 1234 Issue 1, p895-898, 4p, 2 Color Photographs, 4 Diagrams, 1 Graph
- Publication Year :
- 2010
-
Abstract
- For determination of the Avogadro’s number, a self-referenced lattice comparator established at the Photon Factory to deal with a d-spacing mapping measurement over the cross section of a 4 ∼ 5 inches FZ silicon rod. For uncertainty of 1×10<superscript>-8</superscript> of the unit cell volume, it is necessary to measure lattice parameter of silicon with resolution of 3×10<superscript>-9</superscript> at least. In this paper, we report the principle of our lattice comparator, characterize our measurement system, and show some mapping measurement results of FZ silicon with resolution of 3×10<superscript>-9</superscript>. [ABSTRACT FROM AUTHOR]
- Subjects :
- SILICON
PHOTONS
AVOGADRO constant
NONMETALS
POROUS silicon
Subjects
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 1234
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 51975345
- Full Text :
- https://doi.org/10.1063/1.3463361