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A Silicon d-spacing Mapping Measurement System With Resolution of 10-9.

Authors :
Xiaowei Zhang
Sugiyama, Hiroshi
Fugimoto, Hiroyuki
Waseda, Atsushi
Takatomi, Toshikazu
Source :
AIP Conference Proceedings; 6/24/2010, Vol. 1234 Issue 1, p895-898, 4p, 2 Color Photographs, 4 Diagrams, 1 Graph
Publication Year :
2010

Abstract

For determination of the Avogadro’s number, a self-referenced lattice comparator established at the Photon Factory to deal with a d-spacing mapping measurement over the cross section of a 4 ∼ 5 inches FZ silicon rod. For uncertainty of 1×10<superscript>-8</superscript> of the unit cell volume, it is necessary to measure lattice parameter of silicon with resolution of 3×10<superscript>-9</superscript> at least. In this paper, we report the principle of our lattice comparator, characterize our measurement system, and show some mapping measurement results of FZ silicon with resolution of 3×10<superscript>-9</superscript>. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
1234
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
51975345
Full Text :
https://doi.org/10.1063/1.3463361