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A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops.

Authors :
Loveless, T. Daniel
Massengill, Lloyd W.
Bhuva, Bharat L.
Holman, W. Timothy
Casey, Megan C.
Reed, Robert A.
Nation, Sarah A.
McMorrow, Dale
Melinger, Joseph S.
Source :
IEEE Transactions on Nuclear Science; Dec2008 Part 1 of 2, Vol. 55 Issue 6, p3447-3455, 9p, 3 Diagrams, 8 Graphs
Publication Year :
2008

Abstract

A voltage-controlled-oscillator (VCO) circuit has been designed for radiation-hardened-by-design (RHBD) single-event transient (SET) mitigation. The RHBD technique, which can be readily implemented in mixed-signal phase-locked loops and delay-locked loops, is shown to substantially improve the single-event performance of the VCO while decreasing the RMS phase jitter due to power supply noise. Additionally, using the probabilistic analysis technique presented, the RHBD VCO shows a maximally improved SET response over that of the conventional VCO, decreasing the output phase displacement to below the nominal phase jitter. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189499
Volume :
55
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
52037646
Full Text :
https://doi.org/10.1109/TNS.2008.2005677