A self-repairable threshold cellular array.

Authors :: Sen, A.
Bandyopadhyay, S.
De, P.
Sarma, D.
Choudhury, A.K.
Source :: International Journal of Electronics; Dec74, Vol. 37 Issue 6, p727, 10p, 4 Diagrams, 1 Chart
Publication Year :: 1974
Abstract: In this paper a cellular array has been described where each cell contains a threshold gate. It has been shown that this array can be used to realize any Boolean function and that just two tests are sufficient to test the entire array for faults. An extension of the principle of this array has been described. It deals with the design of an array where a faulty cascade, if there be any, is automatically by-passed and an identical fault-free cascade is introduced into the array. [ABSTRACT FROM AUTHOR]