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Specular x-ray reflectivity study of ordering in self-assembled organic and hybrid organic–inorganic electro-optic multilayer films.
- Source :
- Journal of Chemical Physics; 10/8/2001, Vol. 115 Issue 14, 1 Diagram, 1 Chart, 5 Graphs
- Publication Year :
- 2001
-
Abstract
- Specular x-ray reflectivity has been used to probe the microstructures of siloxane-based self-assembled electro-optic superlattices composed of high-hyperpolarizable organic chromophore arrays intercalated with Ga and In oxide sheets. The film thickness increases linearly as a function of the number of layers, underscoring the high structural regularity and efficiency of the synthetic approach. Relatively dense metal oxide structures are detected in these systems. The x-ray reflectivity data also indicate that the dependence of the relative surface roughness on the number of layers is nearly identical for self-assembled organic and organic–inorganic hybrid film structures. © 2001 American Institute of Physics. [ABSTRACT FROM AUTHOR]
- Subjects :
- SPECULAR reflectance
ELECTROOPTICS
MULTILAYERED thin films
Subjects
Details
- Language :
- English
- ISSN :
- 00219606
- Volume :
- 115
- Issue :
- 14
- Database :
- Complementary Index
- Journal :
- Journal of Chemical Physics
- Publication Type :
- Academic Journal
- Accession number :
- 5252394
- Full Text :
- https://doi.org/10.1063/1.1398576