Cite
Carbon Nanotube Correlation: Promising Opportunity for CNFET Circuit Yield Enhancement.
MLA
Jie Zhang, et al. “Carbon Nanotube Correlation: Promising Opportunity for CNFET Circuit Yield Enhancement.” DAC: Annual ACM/IEEE Design Automation Conference, June 2010, pp. 889–92. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edb&AN=52741535&authtype=sso&custid=ns315887.
APA
Jie Zhang, Bobba, S., Patil, N., Lin, A., Wong, H.-S. P., De Micheli, G., & Mitra, S. (2010). Carbon Nanotube Correlation: Promising Opportunity for CNFET Circuit Yield Enhancement. DAC: Annual ACM/IEEE Design Automation Conference, 889–892.
Chicago
Jie Zhang, Shashikanth Bobba, Nishant Patil, Albert Lin, H. -S. Philip Wong, Giovanni De Micheli, and Subhasish Mitra. 2010. “Carbon Nanotube Correlation: Promising Opportunity for CNFET Circuit Yield Enhancement.” DAC: Annual ACM/IEEE Design Automation Conference, June, 889–92. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edb&AN=52741535&authtype=sso&custid=ns315887.