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Special Section on the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC'09).

Authors :
Kiang, Jean-Fu
Kharkovsky, Sergey
Source :
IEEE Transactions on Instrumentation & Measurement; 12/01/2010, Vol. 59 Issue 12, p3077-3078, 2p
Publication Year :
2010

Abstract

The six articles in this special issue were originally presented at the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC'09), held at the Oriental Institute of Technology, Taipei, Taiwan, on June 24-26, 2009. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189456
Volume :
59
Issue :
12
Database :
Complementary Index
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
55090182
Full Text :
https://doi.org/10.1109/TIM.2010.2078250